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In the fol­lo­wing you will find recent publi­ca­ti­ons of the alli­ance part­ners on the topic of »free­form optics«

asphericon GmbH

  • Free­form capa­bi­lity enab­led by ISO 10110 Proc. SPIE 9582, Opti­cal Sys­tem Align­ment, Tole­ran­cing, and Veri­fi­ca­tion IX, 958202 (3 Sep­tem­ber 2015); doi: 10.1117÷12.2188160
    Sven R. Kiontke; David M. Aik­ens; Richard N. Young­worth
  • Mono­li­thic free­form ele­ment Proc. SPIE 9575, Opti­cal Manu­fac­tu­ring and Tes­ting XI, 95750G (25 Sep­tem­ber 2015); doi: 10.1117÷12.2188138
    Sven R. Kiontke
  • Imple­men­ting ISO stan­dard-com­pli­ant free­form com­po­nent drawings; Opt. Eng. 55(7), 071205 (Apr 07, 2016); doi:10.1117/1.OE.55.7.071205
    Sven R. Kiontke; David M. Aik­ens; Richard N. Young­worth

Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF

  • Tuto­rial: Free­form Metal Optics-Inter­na­tio­nal Con­fe­rence on Space Optics, Tene­rife /​ Spain (2014)
    Geb­hardt, Har­tung, Kinast
  • Proc. ICSO – Inter­na­tio­nal Con­fe­rence on Space Optics (2014); Dimen­sio­nal  sta­bi­lity of metal optics on nickel pla­ted AlSi40
    Kinast, Gra­bow­ski, Geb­hardt, Roh­loff, Rochau, Risse, Tün­ner­mann
  • EUSPEN Free­form Group, Padova /​ Italy (2014); Pos­ter: Struc­tu­red free­forms chal­lenge manu­fac­tu­ring tech­no­lo­gies
    Stein­kopf, Geb­hardt, Risse, Eber­hardt
  • EPIC Work­shop on Free­form Optics, Copen­ha­gen /​ Den­mark (2015); Dia­mond machi­ning of free­form optics
    Stein­kopf, Geb­hardt, Risse, Eber­hardt
  • 7. High-Level-Expert-Mee­ting CC UPOB – Asphere Metro­logy, Brau­schweig (2015); Mea­su­ring posi­tion and figure devia­tion with Com­pu­ter Gene­ra­ted Holo­grams
    Beier, Stumpf, Geb­hardt, Risse, Zeit­ner
  • App­lied Optics 5416, in print (2015); Deve­lop­ment, fabri­ca­tion, and tes­ting of an ana­mor­phic ima­ging snap-tog­e­ther free­form tele­scope
    Beier, Har­tung, Peschel, Damm, Geb­hardt, Schei­ding, Stumpf, Zeit­ner, Risse, Eber­hardt, Tün­ner­mann
  • Proc. EOSMTOC, accep­ted (2015); Ultra-pre­cise manu­fac­tu­ring of asphe­ri­cal mir­rors based on a free­form tech­no­logy for app­li­ca­ti­ons in the VIS spec­tral range
    Risse, Beier, Har­tung, Geb­hardt, Eber­hardt

Institut für Angewandte Physik der FSU Jena

  • FSU-IAP Jah­res­be­richt (2014); Neu­ar­tige Beschrei­bun­gen opti­scher Frei­form­flä­chen
    Brö­mel, Gross, Ole­szko, Har­tung, Lipp­mann
  • Jour­nal of App­lied Phy­sics 116, 173503–173512 (2014); The struc­tu­ral and opti­cal pro­per­ties of black sili­con by induc­tively cou­pled plasma reac­tive ion etching
    Ste­g­lich, Käse­bier, Zilk, Pertsch, Kley, Tün­ner­mann
  • Infra­red Phy­sics & Tech­no­logy 69, 218–221 (2015); Self-orga­ni­zed, effec­tive medium Black Sili­con for infra­red anti­re­flec­tion
    Ste­g­lich, Käse­bier, Schrem­pel, Kley, Tün­ner­mann
  • Proc. SPIE 9372, High Con­trast Meta­st­ruc­tures IV (2015); Brin­ging mir­rors to rest: gra­ting con­cepts for ultra-pre­cise inter­fe­ro­me­try
    Kro­ker, Kley, Tün­ner­mann
  • SPIE Pho­to­nics West 9372–25 (2015); Tailo­ring the angu­lar trans­mis­sion beha­vior of high-con­trast gra­tings
    Kro­ker, Käse­bier, Kley, Tün­ner­mann

JENOPTIK Optical Systems GmbH

  • OSA Ima­ging and App­lied Optics, Arling­ton /​ USA (2015); Describ­ing free­form sur­faces with ortho­go­nal func­tions
    Ochse
  • Pre­dic­ting pola­ri­za­tion per­for­mance of high-nume­ri­cal aper­ture inspec­tion
    Fahr
  • Tole­ran­cing the impact of mid-spa­tial fre­quency sur­face errors of len­ses in dis­tor­tion and image homo­gen­eity
    Uhlen­dorf
  • Describ­ing free­form sur­faces with ortho­go­nal func­tion
    Ochse

Optics Balzers Jena GmbH

  • Proc. SPIE 9241, Sen­sors, Sys­tems, and Next-Genera­tion Satel­li­tes XVIII (2014); Band­pass fil­ter arrays pat­ter­ned by pho­to­li­tho­gra­phy for multi-spec­tral remote sen­sing
    Bauer, Thome, Eisen­ham­mer
  • 10. The­men­tage Grenz- und Ober­flä­chen­tech­nik, 4. Koll. Dünne Schich­ten in der Optik, Leip­zig (2014);  Her­stel­lung von Fil­ter­ar­rays zur mul­tis­pek­tra­len Beob­ach­tung
    Kess­ler, Bauer
  • Pro­cee­dings of SPIE Volume 9627, Opti­cal Sys­tems Design 2015: Advan­ces in Opti­cal Thin Films V, Page 962710–1 – 962710–9 (Sep­tem­ber 23, 2015); »Low scat­te­ring fil­ter coa­tings made by plasma-assisted reac­tive magne­tron sput­te­ring«
    Jan Broß­mann, Marc Lapp­schies, Ste­fan Jakobs, Vol­ker Kir­sch­ner

VITRON Spezialwerkstoffe GmbH

  • Glas­bi­blio­thek: VITRON Chal­ko­ge­nid-Glä­ser für „CODE V“ opt. Design-Pro­gramm, VITRON Chal­ko­ge­nid-Glä­ser für Zemax
  • Opti­sche Para­me­ter – Index, Trans­mis­sion: VITRON Chal­ko­ge­nid-Glass IG2; VITRON Chal­ko­ge­nid-Glass IG3; VITRON Chal­ko­ge­nid-Glass IG4; VITRON Chal­ko­ge­nid-Glass IG5; VITRON Chal­ko­ge­nid-Glass IG6
  • 3rd Inter­na­tio­nal WORK­shop on Infra­red Tech­no­lo­gies
    Hen­kel

 

  • Investigation of TMA systems with different freeform surfaces Paper 9626-28
    Yi Zhong, Fried­rich-Schil­ler-Univ.
    Jena (Ger­many); Her­bert Gross, Fried­rich-Schil­ler-Univ. Jena (Ger­many), Fraun­ho­fer-Insti­tut für Ange­wandte Optik und Fein­me­cha­nik (Ger­many); Anika Broemel, Fried­rich-Schil­ler-Univ. Jena (Ger­many); Stef­fen Kirsch­stein, Paul Petruck, Jena-Optro­nik GmbH (Ger­many); Andreas Tün­ner­mann, Fraun­ho­fer-Insti­tut für Ange­wandte Optik und Fein­me­cha­nik (Ger­many), Fried­rich-Schil­ler-Univ. Jena (Ger­many)
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