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asphericon GmbH

  • Free­form capa­bi­lity enab­led by ISO 10110 Proc. SPIE 9582, Opti­cal Sys­tem Align­ment, Tole­ran­cing, and Veri­fi­ca­tion IX, 958202 (3 Sep­tem­ber 2015); doi: 10.1117÷12.2188160
    Sven R. Kion­tke; David M. Aik­ens; Richard N. Youngworth
  • Mono­li­thic free­form ele­ment Proc. SPIE 9575, Opti­cal Manu­fac­tu­ring and Tes­ting XI, 95750G (25 Sep­tem­ber 2015); doi: 10.1117÷12.2188138
    Sven R. Kiontke
  • Imple­men­ting ISO stan­dard-com­pli­ant free­form com­po­nent drawings; Opt. Eng. 55(7), 071205 (Apr 07, 2016); doi:10.1117/1.OE.55.7.071205
    Sven R. Kion­tke; David M. Aik­ens; Richard N. Youngworth
  • Free­form sur­face revo­lu­tio­nize opti­cal sys­tems”, Laser & Pho­to­nics 01/​2017, p. 96–98.
    Ulrike Fuchs
  • Dis­cus­sing design for manu­fac­tura­bi­lity for two free­form ima­ging sys­tems. Proc. SPIE 9948, Novel Opti­cal Sys­tems Design and Opti­miz­a­tion XIX, 99480L (2016); doi:10.1117/12.2237187.
    Ulrike Fuchs; Sven R. Kiontke
  • Asphere wedge and decen­ter: What you see is not always what you get. Proc. SPIE 9951, Opti­cal Sys­tem Align­ment, Tole­ran­cing, and Veri­fi­ca­tion X, 99510I (2016); doi:10.1117/12.2237051.
    Tra­bert; Ulrike Fuchs; Sven R. Kiontke
  • Impro­ving spec­tro­me­ter field of view cor­rec­tion with a free­form sur­face. Proc. SPIE 9948, Novel Opti­cal Sys­tems Design and Opti­miz­a­tion XIX, 99480K (2016); doi:10.1117/12.2236141.
    Sven Wicken­ha­gen; Peter Petruck; Ulrike Fuchs
  • Alva­rez Free­form Sys­tem for Diver­gence Adjus­t­ment, in Opti­cal Design and Fab­ri­ca­tion 2017 (Free­form, IODC, OFT), OSA Tech­ni­cal Digest (online), paper JW3C.3, (2017).
    Ulrike Fuchs; Sven Wicken­ha­gen; Anna Möhl
  • Con­trol your Free­form Sur­face Form Devia­tion and Cen­tra­tion – It is only a Mat­ter of Balance, in Opti­cal Design and Fab­ri­ca­tion 2017 (Free­form, IODC, OFT), OSA Tech­ni­cal Digest (online), paper JTu3A.5, (2017).
    Ulrike Fuchs; Sven R. Kion­tke; Sven Wickenhagen
  • Fab­ri­ca­tion and Metro­logy Chal­len­ges for Free­form Com­mer­cial Ima­ging Sys­tem Deve­lo­p­ment, in Opti­cal Design and Fab­ri­ca­tion 2017 (Free­form, IODC, OFT), OSA Tech­ni­cal Digest (online), paper JTh1C.5, (2017). [invi­ted] Ulrike Fuchs
  • Ready to use a multi-focal sys­tem based on Alva­rez len­ses, Proc. SPIE 10690, Opti­cal Design and Engi­nee­ring VII, 1069017 (2018).
    Anna Möhl; Sven Wicken­ha­gen; T. Kunisch; Ulrike Fuchs
  • Modu­lar beam shaping and mani­pu­la­tion of pola­riz­a­tion sta­tes using asphe­ric and free­form opti­cal com­pon­ents,” LANE, 10th CIRP Con­fe­rence on Pho­to­nic Tech­no­lo­gies, (2019). [invi­ted] Anna Möhl; Ulrike Fuchs
  • Describ­ing Mid-Spa­tial Fre­quen­cies con­sist­ently for Opti­cal Design, Manu­fac­tu­ring and Metro­logy, OSA Fron­tiers in Optics, paper FM3D.5, (2018).
    Sven Wicken­ha­gen; Anna Möhl; Ulrike Fuchs
  • Fab­ri­ca­tion, Metro­logy and Align­ment Chal­len­ges or Free­form Ima­ging Sys­tems, Opti­cal Design and Fab­ri­ca­tion (Free­form Optics), OSA, paper JW1A.1, (2019). [invi­ted] Ulrike Fuchs
  • Ana­ly­zing and Mini­mi­zing Mid-spa­tial Fre­quency Errors, Opti­cal Design and Fab­ri­ca­tion (Opti­cal fab­ri­ca­tion and tes­ting), OSA, paper OW4A.1, (2019). [invi­ted] Ulrike Fuchs; Sven R. Kiontke

Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF

  • Tuto­rial: Free­form Metal Optics-Inter­na­tio­nal Con­fe­rence on Space Optics, Tene­rife /​ Spain (2014)
    Geb­hardt, Har­tung, Kinast
  • Proc. ICSO – Inter­na­tio­nal Con­fe­rence on Space Optics (2014); Dimen­sio­nal  sta­bi­lity of metal optics on nickel pla­ted AlSi40
    Kinast, Gra­bow­ski, Geb­hardt, Roh­loff, Rochau, Risse, Tünnermann
  • EUSPEN Free­form Group, Padova /​ Italy (2014); Pos­ter: Struc­tu­red free­forms chal­lenge manu­fac­tu­ring technologies
    Stein­kopf, Geb­hardt, Risse, Eberhardt
  • EPIC Work­shop on Free­form Optics, Copen­ha­gen /​ Den­mark (2015); Dia­mond machi­ning of free­form optics
    Stein­kopf, Geb­hardt, Risse, Eberhardt
  • 7. High-Level-Expert-Mee­ting CC UPOB – Asphere Metro­logy, Brau­schweig (2015); Mea­su­ring posi­tion and figure devia­tion with Com­pu­ter Gene­ra­ted Holograms
    Beier, Stumpf, Geb­hardt, Risse, Zeitner
  • App­lied Optics 5416, in print (2015); Deve­lo­p­ment, fab­ri­ca­tion, and tes­ting of an ana­mor­phic ima­ging snap-tog­e­ther free­form telescope
    Beier, Har­tung, Peschel, Damm, Geb­hardt, Schei­ding, Stumpf, Zeit­ner, Risse, Eber­hardt, Tünnermann
  • Proc. EOSMTOC, accep­ted (2015); Ultra-pre­cise manu­fac­tu­ring of asphe­ri­cal mir­rors based on a free­form tech­no­logy for app­li­ca­ti­ons in the VIS spec­tral range
    Risse, Beier, Har­tung, Geb­hardt, Eberhardt 

Institut für Angewandte Physik der FSU Jena

  • FSU-IAP Jah­res­be­richt (2014); Neu­ar­tige Beschrei­bun­gen opti­scher Freiformflächen
    Brö­mel, Gross, Ole­szko, Har­tung, Lippmann
  • Jour­nal of App­lied Phy­sics 116, 173503–173512 (2014); The struc­tu­ral and opti­cal pro­per­ties of black sili­con by induc­tively cou­pled plasma reac­tive ion etching
    Ste­g­lich, Käse­bier, Zilk, Pertsch, Kley, Tünnermann
  • Infra­red Phy­sics & Tech­no­logy 69, 218–221 (2015); Self-orga­ni­zed, effec­tive medium Black Sili­con for infra­red antireflection
    Ste­g­lich, Käse­bier, Schrem­pel, Kley, Tünnermann
  • Proc. SPIE 9372, High Con­trast Meta­st­ruc­tures IV (2015); Brin­ging mir­rors to rest: gra­ting con­cepts for ultra-pre­cise interferometry
    Kro­ker, Kley, Tünnermann
  • SPIE Pho­to­nics West 9372–25 (2015); Tailo­ring the angu­lar trans­mis­sion beha­vior of high-con­trast gratings
    Kro­ker, Käse­bier, Kley, Tünnermann

JENOPTIK Optical Systems GmbH

  • OSA Ima­ging and App­lied Optics, Arling­ton /​ USA (2015); Describ­ing free­form sur­faces with ortho­go­nal functions
  • Pre­dic­ting pola­riz­a­tion per­for­mance of high-nume­ri­cal aper­ture inspection
  • Tole­ran­cing the impact of mid-spa­tial fre­quency sur­face errors of len­ses in dis­tor­tion and image homogeneity
  • Describ­ing free­form sur­faces with ortho­go­nal function

Optics Balzers Jena GmbH

  • Proc. SPIE 9241, Sen­sors, Sys­tems, and Next-Genera­tion Satel­li­tes XVIII (2014); Band­pass fil­ter arrays pat­ter­ned by pho­to­li­tho­gra­phy for multi-spec­tral remote sensing
    Bauer, Thome, Eisenhammer
  • 10. The­men­tage Grenz- und Ober­flä­chen­tech­nik, 4. Koll. Dünne Schich­ten in der Optik, Leip­zig (2014);  Her­stel­lung von Fil­ter­ar­rays zur mul­tispek­tra­len Beobachtung
    Kess­ler, Bauer
  • Pro­cee­dings of SPIE Volume 9627, Opti­cal Sys­tems Design 2015: Advan­ces in Opti­cal Thin Films V, Page 962710–1 – 962710–9 (Sep­tem­ber 23, 2015); »Low scat­te­ring fil­ter coa­tings made by plasma-assis­ted reac­tive magne­tron sputtering«
    Jan Broß­mann, Marc Lapp­schies, Ste­fan Jakobs, Vol­ker Kirschner

VITRON Spezialwerkstoffe GmbH

  • Glas­bi­blio­thek: VITRON Chal­ko­ge­nid-Glä­ser für „CODE V“ opt. Design-Pro­gramm, VITRON Chal­ko­ge­nid-Glä­ser für Zemax
  • Opti­sche Para­me­ter – Index, Trans­mis­sion: VITRON Chal­ko­ge­nid-Glass IG2; VITRON Chal­ko­ge­nid-Glass IG3; VITRON Chal­ko­ge­nid-Glass IG4; VITRON Chal­ko­ge­nid-Glass IG5; VITRON Chal­ko­ge­nid-Glass IG6
  • 3rd Inter­na­tio­nal WORK­shop on Infra­red Technologies


  • Investigation of TMA systems with different freeform surfaces Paper 9626-28
    Yi Zhong, Fried­rich-Schil­ler-Univ.
    Jena (Ger­many); Her­bert Gross, Fried­rich-Schil­ler-Univ. Jena (Ger­many), Fraun­ho­fer-Insti­tut für Ange­wandte Optik und Fein­me­cha­nik (Ger­many); Anika Broemel, Fried­rich-Schil­ler-Univ. Jena (Ger­many); Stef­fen Kirsch­stein, Paul Petruck, Jena-Optro­nik GmbH (Ger­many); Andreas Tün­ner­mann, Fraun­ho­fer-Insti­tut für Ange­wandte Optik und Fein­me­cha­nik (Ger­many), Fried­rich-Schil­ler-Univ. Jena (Ger­many)
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